Patent assignee · US · COMPANY

ZYVEX LABS, LLC

18Patents
12Active
18Granted
47Portfolio score

Filing activity: Jun 19, 2001 → Jul 20, 2020 · 4 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US7519603B2 Efficient data structure Physics 34 Expired
US7687146B1 Simple tool for positional diamond mechanosynthesis, and its method of manufacture Emerging Cross-Sectional Technologies 29 Active
US7326293B2 Patterned atomic layer epitaxy Chemistry; Metallurgy 21 Expired
US7272607B2 System and method for processing a hierarchical data tree Emerging Cross-Sectional Technologies 21 Expired
US9386954B2 Method of fabricating a multi-electrode array Emerging Cross-Sectional Technologies 9 Active
US9329201B2 Methods, devices, and systems for forming atomically precise structures Electricity 6 Active
US7637142B2 Calibration for automated microassembly Performing Operations; Transporting 5 Active
US7538470B2 Monolithic nanoscale actuation Emerging Cross-Sectional Technologies 4 Active
US7272608B2 Isosurface extraction into splat hierarchy Physics 3 Expired
US7314382B2 Apparatus and methods of manufacturing and assembling microscale and nanoscale components and assemblies Emerging Cross-Sectional Technologies 2 Expired
US7240420B1 System and method for post-fabrication reduction of minimum feature size spacing of microcomponents Emerging Cross-Sectional Technologies 1 Expired
US10814133B2 Methods of fabricating an implantable device Human Necessities 1 Active
US10071254B2 Optically based devices, systems, and methods for neuromodulation stimulation and monitoring Electricity 0 Active
US11313787B2 Sensor device for biosensing and other applications Physics 0 Active
US9867979B2 Three-dimensional multi-electrode array Emerging Cross-Sectional Technologies 0 Active
US7799132B2 Patterned atomic layer epitaxy Chemistry; Metallurgy 0 Active
US10495665B2 Methods, devices and systems for scanning tunneling microscopy control system design Physics 0 Active
US10983142B2 Depassivation lithography by scanning tunneling microscopy Electricity 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.