Patent · US Active

Voltage level monitoring of an integrated circuit for production test and debug

US10502784B2 · kind B2 · utility

3Cited by

3References

26Claims

0Family size

Assignee

STMicroelectronics International N.V. · NL

Inventors

Venkata Narayanan Srinivasan · Greater Noida, IN
Satinder Singh Malhi · Noida, IN

Key dates

Filing date	Sep 22, 2017
Grant date	Dec 10, 2019
Priority date	—
Expiry date	Feb 28, 2038

Classification

Technology area (CPC H)Electricity
CPC primaryH01L22/34
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A scan chain collects scan chain data from testing of a functional circuit and outputs a scan chain signal containing the scan chain data. A voltage monitor circuit operates to compare a supply voltage against a threshold and assert a reset signal when the supply voltage crosses the threshold. The reset signal resets a flip flop circuit whose output signal controls operation of a logic circuit that blocks passage of the scan chain signal to an integrated circuit probe pad and instead applies a constant logic signal to the probe pad indicating a voltage monitoring error.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.