Patent · US Active

Die

US10510677B2 · kind B2 · utility

0Cited by
6References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 2018
Grant dateDec 17, 2019
Priority date
Expiry dateAug 21, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2223/5446
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor structure includes a wafer comprising a plurality of viewing fields defined thereon, a plurality of dies defined by a scribe line formed in each viewing field, a plurality of mark patterns formed in the scribe line, and a plurality of anchor pattern respectively formed in the review fields, the anchor patterns being different from the mark patterns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.