Wafer-level package having multiple dies arranged in side-by-side fashion and associated yield improvement method
US10515939B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 3, 2016 |
| Grant date | Dec 24, 2019 |
| Priority date | — |
| Expiry date | Feb 3, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/15311
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A wafer-level package includes a plurality of dies and a plurality of connection paths. The dies include at least a first die and a second die. The dies are arranged in a side-by-side fashion, and a first side of the first die is adjacent to a first side of the second die. The connection paths connect input/output (I/O) pads arranged on the first side of the first die to I/O pads arranged on the first side of the second die, wherein adjacent I/O pads on the first side of the first die are connected to adjacent I/O pads on the first side of the second die via connection paths on only a single layer. For example, the first die is identical to the second die. For another example, the wafer-level package is an integrated fan-out (InFO) package or a chip on wafer on substrate (CoWoS) package. For yet another example, the dies are assembled in the wafer-level package to perform a network switch function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.