Inventor · Taipei, TW

Yi-Hung Chen

72Patents
12h-index
91Co-inventors
87Inventor score

Filing activity: May 21, 2001 → Jan 22, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
USD490068S1 MP3 player General 147 Expired
USD584429S1 Lamp General 92 Expired
US8985815B2 Light bulb with upward and downward facing LEDs having heat dissipation Mechanical Engineering; Lighting; Heating 42 Active
USD630347S1 Lamp General 41 Expired
USD603548S1 Lamp General 36 Expired
USD619292S1 Lamp General 31 Expired
US6667926B1 Memory read/write arbitration method Physics 28 Expired
USD629537S1 LED lamp General 26 Expired
USD630349S1 Lamp General 22 Expired
USD636902S1 Lighting device General 21 Expired
USD652156S1 Light emitting diode lamp General 18 Expired
USD608487S1 Lamp General 15 Expired
USD627915S1 Lamp General 10 Expired
US9671830B2 Electronic device having stand module Mechanical Engineering; Lighting; Heating 10 Active
USD505675S1 External enclosure General 7 Expired
US10515939B2 Wafer-level package having multiple dies arranged in side-by-side fashion and associated yield improvement method Electricity 7 Active
US10283548B1 CMOS sensors and methods of forming the same Electricity 6 Active
US11272861B1 Personal cloud with a plurality of modular capabilities Electricity 6 Active
US11404788B1 Surface mount antenna elements for use in an antenna array Electricity 5 Active
US10261928B2 Wafer-level package having one die with its clock source shared by multiple dies and associated clock generating method Electricity 4 Active
US8556454B2 Light tube Mechanical Engineering; Lighting; Heating 4 Active
US9484376B2 Semiconductor isolation structure and manufacturing method thereof Electricity 4 Active
US10037293B2 Wafer-level package having asynchronous FIFO buffer used to deal with data transfer between different dies and associated method Electricity 4 Active
US6710889B2 Method for improved dielectric layer metrology calibration Physics 3 Expired
USD599920S1 Lamp General 3 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.