Electrostatic discharge shielding semiconductor device and electrostatic discharge testing method thereof
US10522530B2 · kind B2 · utility
0Cited by
5References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 21, 2018 |
| Grant date | Dec 31, 2019 |
| Priority date | — |
| Expiry date | Mar 21, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D89/911
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
An electrostatic discharge (ESD) shielding semiconductor device and an ESD testing method thereof, the ESD shielding semiconductor device includes an integrated circuit, a seal ring and a conductive layer. The integrated circuit is disposed on a die, and the integrated circuit has a first region and a second region. The seal ring is disposed on the die to surround the integrated circuit. The conductive layer at least covers the first region, and which is electrically connected to the seal ring.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.