Post-silicon validation and debug using symbolic quick error detection
US10528448B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 6, 2016 |
| Grant date | Jan 7, 2020 |
| Priority date | — |
| Expiry date | Dec 24, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3079
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are improved methods and structures for verifying integrated circuits and in particular systems-on-a-chip constructed therefrom. We call methods and structures according to the present disclosure Symbolic Quick Error Detection or Symbolic QED, Illustrative characteristics of Symbolic QED include: 1) It is applicable to any System-on-Chip (SoC) design as long as it contains at least one programmable processor; 2) It is broadly applicable for logic bugs inside processor cores, accelerators, and uncore components; 3) It does not require failure reproduction; 4) It does not require human intervention during bug localization; 5) It does not require trace buffers, 6) It does not require assertions; and 7) It uses hardware structures called “change detectors” which introduce only a small area overhead. Symbolic QED exhibits: 1) A systematic (and automated) approach to inserting “change detectors” during a design phase; 2) Quick Error Detection (QED) tests that detect bugs with short error detection latencies and high coverage; and 3) Formal techniques that enable bug localization and generation of minimal bug traces upon bug detection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.