Patent · US Active

Atomically precise surface engineering for producing imagers

US10541266B2 · kind B2 · utility

0Cited by
14References
11Claims
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Assignee

Inventors

Key dates

Filing dateAug 18, 2015
Grant dateJan 21, 2020
Priority date
Expiry dateAug 18, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/805

Abstract

High-quality surface coatings, and techniques combining the atomic precision of molecular beam epitaxy and atomic layer deposition, to fabricate such high-quality surface coatings are provided. The coatings made in accordance with the techniques set forth by the invention are shown to be capable of forming silicon CCD detectors that demonstrate world record detector quantum efficiency (>50%) in the near and far ultraviolet (155 nm-300 nm). The surface engineering approaches used demonstrate the robustness of detector performance that is obtained by achieving atomic level precision at all steps in the coating fabrication process. As proof of concept, the characterization, materials, and exemplary devices produced are presented along with a comparison to other approaches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.