Patent · US Active

Marco inspection systems, apparatus and methods

US10545096B1 · kind B1 · utility

4Cited by
11References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2019
Grant dateJan 28, 2020
Priority date
Expiry dateJan 30, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30148
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, a lens having a view encompassing the specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens. In some implementations, the inspection apparatus includes an image processing system configured for receiving image data from the imaging device, analyzing the image data to determine a specimen classification, and automatically selecting an illumination profile based on the specimen classification. Methods and machine-readable media are also contemplated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.