Inventor · Four Corners, FL, US

John B. Putman

104Patents
8h-index
37Co-inventors
80Inventor score

Filing activity: Oct 2, 1989 → Apr 8, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US11156992B2 Predictive process control for a manufacturing process Physics 32 Active
US11117328B2 Systems, methods, and media for manufacturing processes Physics 31 Active
US11156991B2 Predictive process control for a manufacturing process Physics 30 Active
US6795172B2 Method for preparing a cut surface in uncured rubber samples for measuring filter dispersion Physics 20 Expired
US10048477B1 Camera and specimen alignment to facilitate large area imaging in microscopy Electricity 17 Active
US10169852B1 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Physics 16 Active
US10247910B1 Systems, devices and methods for automatic microscopic focus Physics 9 Active
US9488819B2 Automatic microscopic focus system and method for analysis of transparent or low contrast specimens Physics 9 Active
US4953406A Rheometer die assembly Physics 8 Expired
US10146041B1 Systems, devices and methods for automatic microscope focus Electricity 6 Active
US10481379B1 Method and system for automatically mapping fluid objects on a substrate Physics 5 Active
US10578850B1 Fluorescence microscopy inspection systems, apparatus and methods Electricity 5 Active
US6775004B1 Measuring surface roughness to calculate filler dispersion in a polymer sample Physics 5 Expired
US10545096B1 Marco inspection systems, apparatus and methods Physics 4 Active
US6681617B1 Variable eccentric rheometer system Physics 4 Expired
US10254214B1 Systems, devices, and methods for combined wafer and photomask inspection Electricity 3 Active
US10467740B1 Systems, devices, and methods for providing feedback on and improving the accuracy of super-resolution imaging Physics 3 Active
US9561566B2 Continuously scanning XY translation stage Electricity 2 Active
US10509199B2 Systems, devices and methods for automatic microscopic focus Physics 2 Active
US11086988B1 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data Physics 2 Active
US11672933B1 Method and system for bi-level treatment of sleep apnea Human Necessities 2 Active
US11063965B1 Dynamic monitoring and securing of factory processes, equipment and automated systems Emerging Cross-Sectional Technologies 2 Active
US11100221B2 Dynamic monitoring and securing of factory processes, equipment and automated systems Electricity 1 Active
US10416426B2 Camera and specimen alignment to facilitate large area imaging in microscopy Electricity 1 Active
US11727672B1 System and method for generating training data sets for specimen defect detection Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.