Patent · US Active

Positioning system for materials testing

US10551169B1 · kind B1 · utility

4Cited by
3References
27Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 27, 2018
Grant dateFeb 4, 2020
Priority date—
Expiry dateApr 27, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0682
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Positioning systems adapted to allow repeatable positioning of a test specimen within a test frame, and/or positioning of a sensor (e.g., an extensometer) relative to the specimen. In some embodiments, the positioning system includes two lasers (or other pattern illumination sources) attached to a head, each laser adapted to illuminate a line or other pattern on a face of the test specimen. The two lasers may be configured such that, once the head is at a calibrated working distance from the test specimen, the two patterns intersect one another in a predetermined geometry (e.g., the two lines align (become collinear) with one another).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.