Patent assignee · US · COMPANY

Epsilon Technology Corporation

19Patents
1Active
19Granted
36Portfolio score

Filing activity: Apr 9, 1987 → Apr 27, 2018

Most-cited patents

PatentTitleAreaCited byStatus
US5221556A Gas injectors for reaction chambers in CVD systems Chemistry; Metallurgy 665 Expired
US4828224A Chemical vapor deposition system Emerging Cross-Sectional Technologies 485 Expired
US5198034A Rotatable substrate supporting mechanism with temperature sensing device for use in chemical vapor deposition equipment Electricity 262 Expired
US4836138A Heating system for reaction chamber of chemical vapor deposition equipment Chemistry; Metallurgy 113 Expired
US5080549A Wafer handling system with Bernoulli pick-up Emerging Cross-Sectional Technologies 103 Expired
US4975561A Heating system for substrates Chemistry; Metallurgy 63 Expired
US4846102A Reaction chambers for CVD systems Chemistry; Metallurgy 61 Expired
US4813732A Apparatus and method for automated wafer handling Emerging Cross-Sectional Technologies 59 Expired
US5020475A Substrate handling and transporting apparatus Chemistry; Metallurgy 43 Expired
US5092728A Substrate loading apparatus for a CVD process Chemistry; Metallurgy 42 Expired
US5117769A Drive shaft apparatus for a susceptor Electricity 37 Expired
US4996942A Rotatable substrate supporting susceptor with temperature sensors Electricity 33 Expired
US5261960A Reaction chambers for CVD systems Chemistry; Metallurgy 19 Expired
US5318634A Substrate supporting apparatus Electricity 18 Expired
US5096534A Method for improving the reactant gas flow in a reaction chamber Chemistry; Metallurgy 18 Expired
US5156521A Method for loading a substrate into a GVD apparatus Chemistry; Metallurgy 18 Expired
US5044315A Apparatus for improving the reactant gas flow in a reaction chamber Chemistry; Metallurgy 11 Expired
US4993355A Susceptor with temperature sensing device Electricity 9 Expired
US10551169B1 Positioning system for materials testing Physics 4 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.