Structures illumination microscopy system, method, and non-transitory storage medium storing program
US10558030B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 5, 2017 |
| Grant date | Feb 11, 2020 |
| Priority date | — |
| Expiry date | Dec 18, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structured illumination microscopy system including an illumination optical system illuminating excitation light to excite a fluorescent material contained in a sample on the sample with an interference fringe; a controlling part controlling a direction, a phase, and a spatial frequency of the interference fringe; an image-forming optical system forming an image of the sample which is modulated by illumination of the interference fringe; an imaging sensor capturing the image formed by the image-forming optical system; and a demodulating part performing demodulation processing by using a plurality of images captured by the imaging sensor in which the controlling part controls the spatial frequency of the interference fringe in accordance with an illuminating position of the interference fringe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.