Testing integrated circuit designs containing multiple phase rotators
US10585140B2 · kind B2 · utility
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4References
20Claims
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Key dates
| Filing date | Nov 17, 2017 |
| Grant date | Mar 10, 2020 |
| Priority date | — |
| Expiry date | Dec 27, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.