Robert Glen Gerowitz
16Patents
4h-index
19Co-inventors
57Inventor score
Filing activity: Mar 24, 1999 → Jan 10, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6222380A | High speed parallel/serial link for data communication | Chemistry; Metallurgy | 105 | Expired |
| US6681356B1 | Scan chain connectivity | Physics | 17 | Expired |
| US7506225B2 | Scanned memory testing of multi-port memory arrays | Physics | 4 | Active |
| US7768315B2 | Multiplexor with leakage power regulator | Electricity | 4 | Active |
| US7127691B2 | Method and apparatus for manufacturing test generation | Physics | 4 | Expired |
| US8135571B2 | Validating manufacturing test rules pertaining to an electronic component | Physics | 3 | Active |
| US6407569B1 | Integrated circuit with in situ circuit arrangement for testing integrity of differential receiver inputs | Physics | 2 | Expired |
| US7646210B2 | Method and system for low-power level-sensitive scan design latch with power-gated logic | Electricity | 2 | Active |
| US8065641B2 | Automatically creating manufacturing test rules pertaining to an electronic component | Emerging Cross-Sectional Technologies | 1 | Active |
| US6519757B1 | Hardware design language generation for input/output logic level | Physics | 0 | Expired |
| US7865786B2 | Scanned memory testing of multi-port memory arrays | Physics | 0 | Active |
| US9927489B2 | Testing integrated circuit designs containing multiple phase rotators | Physics | 0 | Active |
| US11016144B2 | Testing integrated circuit designs containing multiple phase rotators | Physics | 0 | Active |
| US8136059B2 | Indeterminate state logic insertion | Physics | 0 | Active |
| US10585140B2 | Testing integrated circuit designs containing multiple phase rotators | Physics | 0 | Active |
| US10761136B2 | Testing integrated circuit designs containing multiple phase rotators | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.