Scatter in x-ray apparatus and methods of their use
US10588592B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2015 |
| Grant date | Mar 17, 2020 |
| Priority date | — |
| Expiry date | Jan 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20182
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An x-ray apparatus comprises an x-ray source and an x-ray detector and there between a member that is configured to perturb x-ray photons incident thereon. The apparatus further comprises a first database of values representative of material type and material thicknesses, a second database of scatter radiation values indicative of material type and/or material thicknesses, a processor configured to perform an algorithm which compares the output signal of the x-ray detector with values in the first database and to output a most likely material and/or thickness from the first database; selects from the second database the scatter radiation associated with the material type and/or material thickness; and removes the scatter radiation from an output signal of the x-ray detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.