Metrology system

US10598521B2 · kind B2 · utility

Assignee

• DWFritz Automation, LLC · US

Inventors

• Derek Aqui · Portland, US
• Mark Baker · Wilsonville, US
• Chris Barns · Wilsonville, US
• Robert Batten · Tualatin, US
• Shawn Boling · Wilsonville, US
• Jared Greco · Wilsonville, US
• Garrett Headrick · Newberg, US
• Clint Vandergiessen · Beaverton, US

Key dates

• Filing date: Feb 28, 2019
• Grant date: Mar 24, 2020
• Expiry date: Feb 28, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01B3/1048
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.