Patent · US Active

Plasma etching apparatus

US10622193B2 · kind B2 · utility

1Cited by
10References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 24, 2015
Grant dateApr 14, 2020
Priority date
Expiry dateNov 5, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/34
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma etching apparatus is for etching a substrate and includes at least one chamber, a substrate support positioned within the at least one chamber, and a plasma production device for producing a plasma for use in etching the substrate. The plasma production device comprises an electrically conductive coil which is positioned within the at least one chamber, and the coil is formed from a metallic material which can be sputtered onto an interior surface of the at least one chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.