Real time X-ray dosimeter using diodes with variable thickness degrader
US10627529B2 · kind B2 · utility
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11References
17Claims
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Key dates
| Filing date | Dec 15, 2017 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Jul 6, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/10
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A radiation exposure system having a beam source is provided. The system further includes a variable thickness degrader, positioned between the beam source and an object to be exposed, for providing varying degrees of degradation to a radiation beam emitted from the beam source onto the object. The system also includes a set of detectors, positioned between the variable thickness degrader and the object, for receiving and measuring only a portion of the radiation beam remaining after the degradation of the radiation beam by the variable thickness degrader.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.