Inventor · Jericho, VT, US

John G. Massey

21Patents
3h-index
31Co-inventors
59Inventor score

Filing activity: Feb 1, 2006 → Jan 26, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US8120356B2 Measurement methodology and array structure for statistical stress and test of reliabilty structures Physics 8 Active
US7868640B2 Array-based early threshold voltage recovery characterization measurement Physics 4 Active
US7375371B2 Structure and method for thermally stressing or testing a semiconductor device Physics 3 Active
US11309383B1 Quad-layer high-k for metal-insulator-metal capacitors Electricity 2 Active
US9739824B2 Optimization of integrated circuit reliability Physics 2 Active
US9021328B2 Shared error protection for register banks Electricity 1 Active
US10564214B2 Optimization of integrated circuit reliability Physics 1 Active
US9043683B2 Error protection for integrated circuits Electricity 1 Active
US10989754B2 Optimization of integrated circuit reliability Physics 1 Active
US9041428B2 Placement of storage cells on an integrated circuit Electricity 1 Active
US9006827B2 Radiation hardened memory cell and design structures Electricity 0 Active
US9201727B2 Error protection for a data bus Electricity 0 Active
US12387982B2 Adaptive fill techniques for avoiding electromigration Electricity 0 Active
US11038013B2 Back-end-of-line compatible metal-insulator-metal on-chip decoupling capacitor Electricity 0 Active
US10627529B2 Real time X-ray dosimeter using diodes with variable thickness degrader Physics 0 Active
US10634797B2 Real time X-ray dosimeter using diodes with variable thickness degrader Physics 0 Active
US12393764B2 Thermally coupled aware device placement Physics 0 Active
US10996259B2 Optimization of integrated circuit reliability Physics 0 Active
US9395403B2 Optimization of integrated circuit reliability Physics 0 Active
US11594596B2 Back-end-of-line compatible metal-insulator-metal on-chip decoupling capacitor Electricity 0 Active
US11054459B2 Optimization of integrated circuit reliability Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.