Patent · US Active

Nanostructure barrier for copper wire bonding

US10629334B2 · kind B2 · utility

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Assignee

Inventors

Key dates

Filing dateMay 19, 2018
Grant dateApr 21, 2020
Priority date
Expiry dateMay 19, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/00014
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A nanostructure barrier for copper wire bonding includes metal grains and inter-grain metal between the metal grains. The nanostructure barrier includes a first metal selected from nickel or cobalt, and a second metal selected from tungsten or molybdenum. A concentration of the second metal is higher in the inter-grain metal than in the metal grains. The nanostructure barrier may be on a copper core wire to provide a coated bond wire. The nanostructure barrier may be on a bond pad to form a coated bond pad. A method of plating the nanostructure barrier using reverse pulse plating is disclosed. A wire bonding method using the coated bond wire is disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.