Illumination microscopy systems and methods
US10656403B2 · kind B2 · utility
0Cited by
3References
11Claims
0Family size
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Key dates
| Filing date | Apr 18, 2019 |
| Grant date | May 19, 2020 |
| Priority date | — |
| Expiry date | Apr 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0633
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structured illumination microscopy (SIM) system for generating single focal point patterns of a sample is disclosed. The SIM system performs a focusing, scaling and summing operation on each single focal point that completely scan the sample to produce a high resolution composite image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.