Patent · US Active

Illumination microscopy systems and methods

US10656403B2 · kind B2 · utility

0Cited by
3References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 18, 2019
Grant dateMay 19, 2020
Priority date
Expiry dateApr 18, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/0633
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A structured illumination microscopy (SIM) system for generating single focal point patterns of a sample is disclosed. The SIM system performs a focusing, scaling and summing operation on each single focal point that completely scan the sample to produce a high resolution composite image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.