Patent · US Active

Generation of an RF test signal for testing an RF receive circuit

US10673544B2 · kind B2 · utility

3Cited by

1References

24Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Niels Christoffers · Cambridge, GB
Vincenzo Fiore · Linz, AT
Helmut Kollmann · Linz, AT
Christian Rap · Pasching, AT
Jochen Schrattenecker · Eisenlohrsweg, AT
Peter Unterkircher · Plesching, AT
Christoph Wagner · Remchingen, DE

Key dates

Filing date	Dec 7, 2018
Grant date	Jun 2, 2020
Priority date	—
Expiry date	Dec 7, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01S7/4069
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

The description is of a circuit which, according to one example embodiment, comprises the following: an input circuit node for receiving an RF oscillator signal; a test signal generator circuit, which comprises at least one modulator and which is embodied to generate an RF test signal by modulating the RF oscillator signal. Further, the circuit comprises at least one receive channel with a receiver circuit and a coupler, which is embodied to feed the RF test signal into the receiver circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.