Patent · US Active

Test system having distributed resources

US10677815B2 · kind B2 · utility

2Cited by

130References

22Claims

0Family size

Assignee

Teradyne, Inc. · US

Inventors

Mohamadreza Ray Mirkhani · San Fernando, US
Kevin P. Manning · Thousand Oaks, US
Roya Yaghmai · Westlake Village, US
Timothy Lee Farris · Moorpark, US
Frank Parrish · North Reading, US

Key dates

Filing date	Jun 8, 2018
Grant date	Jun 9, 2020
Priority date	—
Expiry date	Aug 30, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2834
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An example test system has resources that are distributed for access by a device under test (DUT). The example test system includes a device interface board (DIB) having sites to connect to devices to test, and a tester having slots configured to hold test instruments. Each test instrument has resources that are distributed over a dimension of the DIB. The resources are distributed to enable the devices in the sites equal access to the resources.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.