Frank Parrish
19Patents
9h-index
29Co-inventors
72Inventor score
Filing activity: Oct 30, 1987 → Dec 15, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6215320A | High density printed circuit board | Emerging Cross-Sectional Technologies | 72 | Expired |
| US5666397A | Individual telephone line call event buffering system | Electricity | 45 | Expired |
| US6686732B2 | Low-cost tester interface module | Physics | 28 | Expired |
| US4829236A | Digital-to-analog calibration system | Electricity | 24 | Expired |
| US6515499B1 | Modular semiconductor tester interface assembly for high performance coaxial connections | Physics | 15 | Expired |
| US6939175B2 | Coaxial cable for overvoltage protection | Physics | 13 | Expired |
| US7180321B2 | Tester interface module | Electricity | 11 | Expired |
| US9786977B2 | Pocketed circuit board | Electricity | 11 | Active |
| US7504822B2 | Automatic testing equipment instrument card and probe cabling system and apparatus | Physics | 10 | Expired |
| US7977583B2 | Shielded cable interface module and method of fabrication | Emerging Cross-Sectional Technologies | 9 | Active |
| US7815466B2 | Coaxial cable to printed circuit board interface module | Emerging Cross-Sectional Technologies | 8 | Active |
| US6916990B2 | High power interface | Electricity | 5 | Expired |
| US8622752B2 | Probe-card interposer constructed using hexagonal modules | Emerging Cross-Sectional Technologies | 5 | Active |
| US7701232B2 | Rotational positioner and methods for semiconductor wafer test systems | Physics | 3 | Active |
| US7541819B2 | Modularized device interface with grounding insert between two strips | Physics | 2 | Expired |
| US8201328B2 | Coaxial cable to printed circuit board interface module | Emerging Cross-Sectional Technologies | 2 | Active |
| US10677815B2 | Test system having distributed resources | Physics | 2 | Active |
| US11862901B2 | Interposer | Electricity | 0 | Active |
| US11651910B2 | Inductance control system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.