Converged test platforms and processes for class and system testing of integrated circuits

US10677845B2 · kind B2 · utility

Assignee

• Intel Corporation · US

Inventors

• Abram M. Detofsky · Tigard, US
• Evan M. Fledell · Beaverton, US
• Mustapha Amadu Abdulai · Hillsboro, US
• John M. Peterson · Arlington, US
• Dinia P. Kitendaugh · Beaverton, US
• Pooya Tadayon · Portland, US
• Jin Pan · Santa Clara, US
• David Shia · Portland, US

Key dates

• Filing date: Mar 1, 2017
• Grant date: Jun 9, 2020
• Expiry date: Apr 15, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2886
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A testing system and process comprises a converged test platform for structural testing and system testing of an integrated circuit device. The testing system comprises a converged test platform supported by a baseboard of an automated test assembly. The converged test platform comprises a DUT socket for testing an integrated circuit device, at least one testing electronic component selectively electrically coupled to the DUT socket by at least one switch operable to electrically switch at least some testing signals between the automated testing assembly and the DUT socket to the at least one testing electronic component for both structural testing and system testing of the integrated circuit device within the same test flow. The switch(es) and testing electronic component(s) (e.g., an FPGA) can be reprogrammable for testing flexibility and faster through put. Associated processes and methods are provided for both class and system testing using the converged test platform for back-end and front-end testing.