Method of measurement on a machine tool
US10678208B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 14, 2018 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Jun 14, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/50063
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.