System and method for generation of an integrated circuit design
US10678974B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 26, 2017 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | Dec 2, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/333
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for verification of a design of an electronic circuit is provided. The method includes executing test runs of the design. The method further includes increasing a fail counter if the executing of a test run of the test runs failed. The method further includes increasing a pass counter if the executing of the test run of the test runs passed. The method further includes halting the executing of the test runs of the design if the current ratio of the fail counter versus the pass counter exceeds a predetermined threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.