Radiation tolerant microstructured three dimensional semiconductor structure
US10685758B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 21, 2017 |
| Grant date | Jun 16, 2020 |
| Priority date | — |
| Expiry date | Apr 21, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21H1/04
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
According to one embodiment, a product includes an array of three dimensional structures, a cavity region between each of the three dimensional structures, and a first material in contact with at least one surface of each of the three dimensional structures. In addition, each of the three dimensional structures includes a semiconductor material, where at least one dimension of each of the three dimensional structures is in a range of about 0.5 microns to about 10 microns. Moreover, the first material is configured to provide high energy particle and/or ray emissions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.