Sample for measuring particles, method for measuring particles and apparatus for measuring particles
US10697767B2 · kind B2 · utility
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6Claims
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Key dates
| Filing date | Aug 31, 2016 |
| Grant date | Jun 30, 2020 |
| Priority date | — |
| Expiry date | Aug 31, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q30/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.