Hitachi High-Technologies Corporation
2,894Patents
2,454Active
2,894Granted
62Portfolio score
Filing activity: Mar 9, 2000 → Apr 29, 2022 · 1,213 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD557226S1 | Electrode cover for a plasma processing apparatus | General | 597 | Expired |
| US8497213B2 | Plasma processing method | Electricity | 450 | Active |
| USD840364S1 | Electrode cover for a plasma processing apparatus | General | 430 | Active |
| USD556704S1 | Grounded electrode for a plasma processing apparatus | General | 427 | Expired |
| USD827592S1 | Electrode cover for a plasma processing apparatus | General | 422 | Active |
| US6875477B2 | Method for coating internal surface of plasma processing chamber | Chemistry; Metallurgy | 371 | Expired |
| USD614192S1 | Graphical user interface for a computer display | General | 292 | Expired |
| USD614191S1 | Graphical user interface for a computer display | General | 290 | Expired |
| USD633514S1 | Computer display with graphical user interface | General | 183 | Expired |
| US7364956B2 | Method for manufacturing semiconductor devices | Electricity | 163 | Expired |
| USD630649S1 | Graphical user interface for a computer display | General | 160 | Expired |
| USD523153S1 | Main part for immunity analysis machine | General | 142 | Expired |
| USD602496S1 | Graphical user interface for a computer display | General | 126 | Expired |
| US8304725B2 | Charged particle beam system | Electricity | 111 | Active |
| US7388979B2 | Method and apparatus for inspecting pattern defects | Physics | 107 | Active |
| USD630645S1 | Graphical user interface for a computer display | General | 102 | Expired |
| USD630648S1 | Graphical user interface for a computer display | General | 101 | Expired |
| US7761246B2 | Surface inspection method and surface inspection apparatus | Physics | 96 | Active |
| USD770992S1 | Electrode cover for a plasma processing apparatus | General | 92 | Active |
| USD595420S1 | Adapter for a sample rack | General | 91 | Expired |
| USD595421S1 | Adapter for a sample rack | General | 89 | Expired |
| US8779400B2 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Electricity | 88 | Active |
| USD595863S1 | Adapter for a sample rack | General | 87 | Expired |
| US7738916B2 | Portable terminal device with built-in fingerprint sensor | Physics | 85 | Expired |
| USD652839S1 | Graphical user interface for a computer display | General | 80 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.