Waveguide integrated testing
US10698000B1 · kind B1 · utility
1Cited by
17References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2019 |
| Grant date | Jun 30, 2020 |
| Priority date | — |
| Expiry date | Apr 24, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structure and method for providing a housing which includes a high frequency (HF) connection between a device under test (DUT) having a wave port 20 and a load board via a waveguide structure. The waveguide includes a wave insert 42, a waveguide adapter 24 and a conductive compliant member 40 which maintains bias between the adapter 24 and the DUT HF port 20 while also maintaining an RF shield despite the variable height of the DUT wave port. The adapter may also include a projection 64 which is received in a recess in the waveguide so that the shielding between the waveguide and adapter has full integrity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.