Jeffrey C. Sherry
36Patents
6h-index
22Co-inventors
65Inventor score
Filing activity: May 10, 2007 → Oct 5, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8536889B2 | Electrically conductive pins for microcircuit tester | Electricity | 42 | Active |
| US7737708B2 | Contact for use in testing integrated circuits | Physics | 19 | Active |
| US9007082B2 | Electrically conductive pins for microcircuit tester | Physics | 13 | Active |
| US8102184B2 | Test contact system for testing integrated circuits with packages having an array of signal and power contacts | Electricity | 13 | Active |
| US8558554B2 | Electrically conductive Kelvin contacts for microcircuit tester | Physics | 10 | Active |
| US9606143B1 | Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing | Physics | 6 | Active |
| US8354854B2 | Microcircuit testing interface having kelvin and signal contacts within a single slot | Physics | 6 | Active |
| US9500673B2 | Electrically conductive kelvin contacts for microcircuit tester | Physics | 5 | Active |
| US10247755B2 | Electrically conductive kelvin contacts for microcircuit tester | Physics | 4 | Active |
| US8988090B2 | Electrically conductive kelvin contacts for microcircuit tester | Physics | 4 | Active |
| US8912811B2 | Test contact system for testing integrated circuits with packages having an array of signal and power contacts | Electricity | 4 | Active |
| US10274515B1 | Waveguide integrated testing | Physics | 3 | Active |
| US10725069B1 | Integrated circuit contactor for testing ICs and method of construction | Physics | 3 | Active |
| US9678106B2 | Electrically conductive pins for microcircuit tester | Emerging Cross-Sectional Technologies | 2 | Active |
| US9696347B2 | Testing apparatus and method for microcircuit and wafer level IC testing | Emerging Cross-Sectional Technologies | 2 | Active |
| US8937484B2 | Microcircuit tester with slideable electrically conductive pins | Electricity | 2 | Active |
| US10794933B1 | Integrated circuit contact test apparatus with and method of construction | Physics | 2 | Active |
| US9476936B1 | Thermal management for microcircuit testing system | Physics | 2 | Active |
| US11293968B2 | Integrated circuit testing for integrated circuits with antennas | Physics | 2 | Active |
| US10073117B2 | Resilient interposer with electrically conductive slide-by pins as part of a microcircuit tester | Emerging Cross-Sectional Technologies | 1 | Active |
| US11307232B1 | Waveguide integrated circuit testing | Physics | 1 | Active |
| US10698000B1 | Waveguide integrated testing | Physics | 1 | Active |
| US10761112B1 | Self flattening test socket with anti-bowing and elastomer retention | Physics | 1 | Active |
| US9297832B2 | Electrically conductive pins for microcircuit tester | Emerging Cross-Sectional Technologies | 1 | Active |
| US11209458B2 | Integrated circuit contactor for testing ICs and method of construction | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.