Dynamic reliability levels for storage devices
US10700703B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2018 |
| Grant date | Jun 30, 2020 |
| Priority date | — |
| Expiry date | Aug 25, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M13/611
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
To address the storage needs of applications that work with noisy data (e.g. image, sound, video data), where errors can be tolerated to a certain extent and performance is more critical than data fidelity, dynamic reliability levels enable storage devices capable of storing and retrieving data with varying degrees of data fidelity to dynamically change the degree of data fidelity in response to an application's request specifying reliability level. By allowing the application to specify the reliability level at which its data is stored and retrieved, dynamic reliability levels can increase read/write performance without sacrificing application accuracy. The application can specify reliability levels for different types or units of data, such as different reliability levels for metadata as opposed to data and so forth.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.