Patent · US Active

High speed and high precision characterization of VTsat and VTlin of FET arrays

US10718806B2 · kind B2 · utility

0Cited by

1References

20Claims

0Family size

Assignee

GlobalFoundries Inc. · KY

Inventors

Uwe Eckhardt · Dresden, DE
Juergen Boldt · Dresden, DE
Matthias Baer · Hohenstein-Ernstthal, DE
Dirk Fimmel · Radebeul, DE
Karl-Heinz Sandig · Dresden, DE

Key dates

Filing date	Oct 21, 2016
Grant date	Jul 21, 2020
Priority date	—
Expiry date	Jul 1, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/5004
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The present disclosure relates to circuit structures and, more particularly, to circuit structures which detect high speed and high precision characterization of VTsat and VTlin of FET arrays and methods of manufacture and use. The circuit includes a control loop comprised of a differential amplifier, a plurality of FET arrays, and at least one analog switch enabling selection between a calibration mode and an operation mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.