Integrated circuit contactor for testing ICs and method of construction
US10725069B1 · kind B1 · utility
3Cited by
5References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2018 |
| Grant date | Jul 28, 2020 |
| Priority date | — |
| Expiry date | Sep 18, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.