Erase health metric to rank memory portions
US10732856B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 4, 2016 |
| Grant date | Aug 4, 2020 |
| Priority date | — |
| Expiry date | Jul 16, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An exemplary method to rank blocks of a non-volatile memory device includes: for each of a plurality of blocks of a memory device, determining a respective erase health metric (EHM) for each of the blocks by combining an erase difficulty metric and an age metric, including: calculating the erase difficulty metric for a respective block based on erase performance metrics obtained during erase phases of an erase operation performed on the respective block, and determining the age metric for the respective block based on a total number of erase operations performed on the respective block during its lifespan. After determining the respective EHM for each of the blocks, the method includes ranking blocks in accordance with the determined respective EHMs, and selecting a block of the plurality of blocks in accordance with the rankings, and writing data to the selected block.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.