Patent · US Active

Plasma processing apparatus

US10741368B2 · kind B2 · utility

0Cited by
0References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 23, 2018
Grant dateAug 11, 2020
Priority date
Expiry dateJan 2, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6831
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus including: a processing chamber; a sample stage; a vacuum exhaust unit; and a plasma generation unit, the sample stage includes: a first metallic base material having a refrigerant flow path formed therein; a second metallic base material disposed above the first metallic base material and has a lower thermal conductivity than the first metallic base material; and a plurality of lift pins vertically moving the object to be processed with respect to the sample stage. A plurality of through-holes through which the plurality of the lift pins passes is formed in the first and the second metallic base material, and a boss, which electrically insulates the lift pin from the first and the second metallic base material and is formed using an insulating member having a higher thermal conductivity than the second metallic base material, is inserted into each of the plurality of through-holes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.