Patent assignee · JP · COMPANY

HITACHI HIGH-TECH CORPORATION

1,071Patents
1,064Active
1,071Granted
65Portfolio score

Filing activity: Feb 8, 2013 → Apr 23, 2024

Most-cited patents

PatentTitleAreaCited byStatus
USD900760S1 Ion shield plate for semiconductor manufacturing apparatus General 22 Active
USD954986S1 Electrode cover for a plasma processing device General 9 Active
USD907593S1 Discharge chamber for a plasma processing apparatus General 9 Active
USD901407S1 Integrated type ion shield for semiconductor manufacturing apparatus General 8 Active
USD924824S1 Ion shield plate base for semiconductor manufacturing apparatus General 7 Active
USD891636S1 Ring for a plasma processing apparatus General 6 Active
USD1005245S1 Electrode cover for a plasma processing apparatus General 6 Active
USD953566S1 Cuvette General 5 Active
USD953569S1 Cuvette General 5 Active
USD977143S1 Reagent cartridge General 5 Active
USD916038S1 Grounded electrode for a plasma processing apparatus General 5 Active
US11600472B2 Vacuum processing apparatus and operating method of vacuum processing apparatus Electricity 4 Active
US10872745B2 Charged-particle beam system Electricity 4 Active
USD953567S1 Cuvette General 4 Active
US10879037B2 Charged particle beam device with distance setting between irradiation regions in a scan line Electricity 4 Active
USD1008986S1 Ion shield plate for plasma processing apparatus General 4 Active
US10872742B2 Charged particle beam device Electricity 4 Active
US10714304B2 Charged particle beam apparatus Electricity 4 Active
USD1028792S1 Reagent transportation robot General 4 Active
US11011348B2 Scanning electron microscope and sample observation method using scanning electron microscope Electricity 4 Active
US10971347B2 Charged particle beam apparatus Electricity 4 Active
US11079275B2 Far-infrared spectroscopy device Physics 3 Active
US11073525B2 Automatic analyzer Physics 3 Active
USD1029023S1 Display screen with graphical user interface General 3 Active
US10937146B2 Image evaluation method and image evaluation device Physics 3 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.