High power terahertz impulse for fault isolation

US10746780B2 · kind B2 · utility

Assignee

• Intel Corporation · US

Inventors

• Mayue Xie · Phoenix, US
• Simranjit S. Khalsa · Chandler, US
• Hemachandar Tanukonda Devarajulu · Chandler, US
• Deepak Goyal · Phoenix, US
• Zhiguo Qian · Chandler, US

Key dates

• Filing date: Nov 18, 2015
• Grant date: Aug 18, 2020
• Expiry date: Apr 14, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/311
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An apparatus comprises a signal generator circuit, a test probe, a signal sensor circuit, and a defect detection circuit. The signal generator circuit is configured to generate an impulse test signal having an impulse waveform and adjust a bandwidth of the impulse test signal. The test probe is electrically coupled to the signal generator circuit and configured to apply the impulse test signal to a device under test (DUT). The signal sensor circuit is configured to sense a conducted test signal produced by applying the impulse test signal to the DUT with the test probe. The defect detection circuit is configured to generate an indication of a defect in the DUT using the conducted test signal.