Inventor · Phoenix, AZ, US

Deepak Goyal

34Patents
7h-index
70Co-inventors
72Inventor score

Filing activity: Jun 21, 1974 → Aug 4, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7171407B2 Method for streaming XPath processing with forward and backward axes Emerging Cross-Sectional Technologies 50 Expired
US7222317B1 Circuit comparison by information loss matching Physics 44 Expired
US3942163A CCD stack memory organization Physics 18 Expired
US10935593B2 Method of resonance analysis for electrical fault isolation Physics 16 Active
US3997882A Content addressable memory system employing charge coupled device storage and directory registers and N/(1-H) counter refresh synchronization Physics 16 Expired
US7350168B1 System, method and computer program product for equivalence checking between designs with sequential differences Physics 14 Expired
US10754518B1 Techniques for providing customized user interface components in a push notification Electricity 12 Active
US7287235B1 Method of simplifying a circuit for equivalence checking Physics 7 Expired
US8122401B1 System, method, and computer program product for determining equivalence of netlists utilizing at least one transformation Physics 6 Active
US9389064B2 Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens Physics 4 Active
US8117571B1 System, method, and computer program product for determining equivalence of netlists utilizing abstractions and transformations Physics 3 Active
US10361167B2 Electronic assembly using bismuth-rich solder Electricity 3 Active
US7280190B1 Electro-optic time domain reflectometry Physics 2 Active
US9508610B2 Inline measurement of molding material thickness using terahertz reflectance Electricity 1 Active
US9625256B1 Device, system and method for alignment of an integrated circuit assembly Electricity 1 Active
US11346818B2 Method, device and system for non-destructive detection of defects in a semiconductor die Physics 1 Active
US9291576B2 Detection of defect in die Physics 1 Active
US9817028B2 Terahertz transmission contactless probing and scanning for signal analysis and fault isolation Physics 1 Active
US9746428B2 Inline inspection of the contact between conductive traces and substrate for hidden defects using white light interferometer with tilted objective lens Physics 1 Active
US12271742B2 Automatically executing application routines with user inputs Physics 0 Active
US10746780B2 High power terahertz impulse for fault isolation Physics 0 Active
US11791237B2 Microelectronic assemblies including a thermal interface material Electricity 0 Active
US11798861B2 Integrated heat spreader (IHS) with heating element Electricity 0 Active
US11476120B2 Method of sample preparation using dual ion beam trenching Electricity 0 Active
US11551956B2 Method and device for failure analysis using RF-based thermometry Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.