Patent · US Active

Test circuit for electronic device permitting interface control between two supply stacks in a production test of the electronic device

US10747282B2 · kind B2 · utility

2Cited by
6References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 2018
Grant dateAug 18, 2020
Priority date
Expiry dateJan 29, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/0016
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An electronic device includes a power management circuit generating output for a plurality of voltage monitors that each detect whether voltages received from a test apparatus are at least a different minimum threshold. The power management circuit also generates a test enable signal indicative of whether the test apparatus is supplying the minimum required voltages to the electronic device. A control circuit receives the output for the plurality of voltage monitors and the test enable signal and generates at least one control signal as a function of the output for the plurality of voltage monitors and the test enable signal. An output circuit receives the at least one control signal and generates an interface control signal that selectively enables or disables interface with analog intellectual property packages within the electronic device, in response to the at least one control signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.