Method for distinguishing semiconducting nanowires from metallic nanowires
US10755402B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 23, 2018 |
| Grant date | Aug 25, 2020 |
| Priority date | — |
| Expiry date | Aug 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for distinguishing semiconducting nanowires from metallic nanowires is related and including: applying nanowires on a substrate; making a metal electrode on the substrate and electrically connected to the nanowires; taking a SEM image of the nanowires and the metal electrode, wherein the SEM image comprises light segments, and each light segment corresponds to one nanowire; and comparing length of each light segment with length of corresponding one nanowire, when the first length is same as the second length, the corresponding one nanowires is a metallic nanowire; when the first length is shorter than the second length, the corresponding one nanowire is a semiconducting nanowire.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.