Method for examination of a sample by means of the lock-in thermography
US10761039B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 3, 2015 |
| Grant date | Sep 1, 2020 |
| Priority date | — |
| Expiry date | Jun 3, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0077
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method for a non-destructive and image forming examination of a sample (1) by means of a heat flow thermography method where the examination consists of evaluating the presence of any gradients in heat flow velocity at respective depth distances from a surface of the sample (1), comprising exciting the sample (1) by means of periodic heat pulses P1 from at least one excitation source, and capturing thermal image sequences of a thermal flow originating from the heat pulses by at least one infrared camera (5), implementing relative time delays Δt between a starting point of imaging of the respective image sequences and a starting point of the periodic excitation, combining all captured image sequences to a resulting image sequence in which all images are arranged in a correct time sequence, and extracting from the resulting image sequence an indication of the existence and depth distance of a heat flow velocity transition from a surface of the sample. Exciting the sample (1) comprises applying heat pulses to the sample with a lock-in frequency equal to or higher than one fourth of the imaging frequency of the camera for exciting the sample (1), controlling an excitation period of the…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.