DCG Systems, Inc.
55Patents
46Active
55Granted
53Portfolio score
Filing activity: Sep 21, 2004 → Jan 28, 2019 · 23 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7786436B1 | FIB based open via analysis and repair | Electricity | 67 | Active |
| US7659981B2 | Apparatus and method for probing integrated circuits using polarization difference probing | Physics | 29 | Expired |
| US7450245B2 | Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system | Physics | 19 | Expired |
| US8742347B2 | Three-dimensional hot spot localization | Physics | 13 | Active |
| US7842920B2 | Methods and systems of performing device failure analysis, electrical characterization and physical characterization | Physics | 11 | Active |
| US7639025B2 | Collection optics integrating an objective and a SIL | Physics | 11 | Active |
| US7733100B2 | System and method for modulation mapping | Physics | 11 | Active |
| US7990167B2 | System and method for modulation mapping | Physics | 9 | Active |
| US9025020B2 | Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side | Physics | 9 | Active |
| US10761039B2 | Method for examination of a sample by means of the lock-in thermography | Physics | 9 | Active |
| US8645896B1 | Method to transfer failure analysis-specific data between design houses and fab's/FA labs | Physics | 9 | Active |
| US7492529B2 | Bi-convex solid immersion lens | Physics | 8 | Active |
| US7439730B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 7 | Expired |
| US7616312B2 | Apparatus and method for probing integrated circuits using laser illumination | Physics | 7 | Expired |
| US7679358B2 | System and method for voltage noise and jitter measurement using time-resolved emission | Physics | 7 | Active |
| US8860447B2 | Laser assisted device alteration using two-photon absorption | Physics | 6 | Active |
| US9057740B1 | Probe-based data collection system with adaptive mode of probing | Electricity | 6 | Active |
| US9201096B2 | Laser-assisted device alteration using synchronized laser pulses | Physics | 6 | Active |
| US8895923B2 | System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing | Physics | 5 | Active |
| US7897918B2 | System and method for focused ion beam data analysis | Electricity | 5 | Active |
| US7530034B2 | Apparatus and method for circuit operation definition | Physics | 5 | Expired |
| US8754633B2 | Systems and method for laser voltage imaging state mapping | Physics | 5 | Active |
| US9244121B2 | Systems and method for laser voltage imaging state mapping | Physics | 5 | Active |
| US7466852B2 | Time resolved non-invasive diagnostics system | Physics | 5 | Active |
| US7480051B2 | Apparatus and method for hard-docking a tester to a tiltable imager | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.