Measuring circuit for quantizing variations in circuit operating speed
US10763836B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 27, 2019 |
| Grant date | Sep 1, 2020 |
| Priority date | — |
| Expiry date | Sep 27, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00019
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Disclosed is a measuring circuit for quantizing variations in the operating speed of a target circuit. The measuring circuit includes: a signal generator configured to generate a predetermined signal; an adjustable delay circuit configured to generate a first and second delay signals according to the predetermined signal respectively; a signal detector configured to detect the first and second delay signals respectively and thereby generate a first and second detection results respectively; and a calibrating circuit configured to enable a first and second numbers of delay units of the adjustable delay circuit according to the first and second detection results respectively so as to make each of the delays respectively caused by the first and second numbers of delay units be less than a delay threshold, in which the first and second numbers relate to the operating speed of the target circuit operating in the first and second conditions respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.