Inventor · Hsinchu, TW

Ying-Yen Chen

25Patents
2h-index
36Co-inventors
53Inventor score

Filing activity: Dec 23, 2010 → Jan 18, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US9225390B2 Wireless power supplying system and adaptive adjustment method thereof Electricity 3 Active
US10686433B1 Circuit operating speed detecting circuit Electricity 2 Active
US10763836B2 Measuring circuit for quantizing variations in circuit operating speed Electricity 2 Active
US10605861B2 Test device for testing integrated circuit Physics 2 Active
US11073558B2 Circuit having multiple scan modes for testing Physics 1 Active
US8901917B2 Element measurement circuit and method thereof Physics 1 Active
US9157957B1 PLL status detection circuit and method thereof Physics 1 Active
US10416233B2 Electronic apparatus and control method thereof Physics 1 Active
US12032020B2 Calibration data generation circuit and associated method Physics 0 Active
US12430794B2 Online matching and optimization method combining geometry and texture, 3D scanning device, system and non-transitory storage medium Emerging Cross-Sectional Technologies 0 Active
US8907709B1 Delay difference detection and adjustment device and method Electricity 0 Active
US12320849B2 Clock control circuit and method Electricity 0 Active
US11061073B2 Circuit testing system and circuit testing method Physics 0 Active
US9160322B2 Clock edge detection device and method Electricity 0 Active
US11073555B2 Circuit testing system and circuit testing method Physics 0 Active
US9274543B2 Estimation apparatus and method for estimating clock skew Physics 0 Active
US11163003B2 Electronic device test database generating method and electronic device test database generating apparatus Physics 0 Active
US12044721B2 Scan chain designing and circuit testing method Physics 0 Active
US11664805B2 Data mutex filter circuit and data mutex filtering method Electricity 0 Active
US11451222B2 Reliability detection device and reliability detection method Electricity 0 Active
US11488683B2 Device for detecting margin of circuit operating at certain speed Electricity 0 Active
US9568553B2 Method of integrated circuit scan clock domain allocation and machine readable media thereof Physics 0 Active
US10496505B2 Integrated circuit test method Physics 0 Active
US10234503B2 Debugging method executed via scan chain for scan test and related circuitry system Physics 0 Active
US12211570B2 Test circuit and method for reading data from a memory device during memory dump Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.