Virtual channels for eddy current array probes
US10775346B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 30, 2017 |
| Grant date | Sep 15, 2020 |
| Priority date | — |
| Expiry date | Sep 5, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9053
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is an apparatus and method for generating virtual inspection channels mid-way between the physical inspection channels of an eddy current array probe, thereby reducing the coverage loss and improving defect sizing and imaging. The method is based upon a calibration to determine the mid-channel coverage loss for parallel defects having their long axis parallel to the scanning direction. Based on the coverage loss measurement, a vector analysis system is constructed enabling generation of virtual channel signals which are available for processing in the same way as physical channels, with impedance plane representation including real and/or imaginary signal components. The system differentiates between parallel and perpendicular defects and employs different algorithms to generate virtual channel signals for parallel and perpendicular defect orientations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.