Inventor · Magnolia Trace, QC, CA

Benoit Lepage

46Patents
5h-index
26Co-inventors
69Inventor score

Filing activity: Oct 15, 1996 → Sep 8, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US5755339A Retaining device for transporting stacks of on-edge supported sheets of float glass Performing Operations; Transporting 19 Expired
US8049494B2 Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry Physics 10 Active
US9625424B2 System and a method of automatically generating a phased array ultrasound scan plan for non-destructive inspection Physics 9 Active
US8264221B2 Eddy current probe assembly adjustable for inspecting test objects of different sizes Physics 6 Active
US8704513B2 Shielded eddy current coils and methods for forming same on printed circuit boards Physics 6 Active
US8700342B2 Multi-frequency bond testing Physics 3 Active
US9032802B2 Phased array system and method for inspecting helical submerged arcs weld (HSAW) Physics 3 Active
US8018228B2 High resolution and flexible eddy current array probe Physics 3 Active
US8698778B2 Method of manipulating impedance plane with a multi-point touch on touch screen Physics 3 Active
US9759692B2 System and method of dynamic gating in non-destructive weld inspection Physics 3 Active
US9952185B1 Method of calibrating a phased array ultrasonic system without known test object sound speed Physics 2 Active
US10101304B2 Phased array system capable of computing gains for non-measured calibration points Physics 2 Active
US11474076B2 Acoustic model acoustic region of influence generation Physics 1 Active
US8816680B2 Eddy current array configuration with reduced length and thickness Physics 1 Active
US10309934B2 Method and system of deducing sound velocity using time-of-flight of surface wave Physics 1 Active
US7505859B2 Method and algorithms for inspection of longitudinal defects in an eddy current inspection system Physics 1 Active
US9110036B2 Assembly with a universal manipulator for inspecting dovetail of different sizes Physics 1 Active
US11249053B2 Ultrasonic inspection configuration with beam overlap verification Physics 0 Active
US12153019B2 Adaptive total focusing method (TFM) such as for zero-degree acoustic inspection Physics 0 Active
US8896300B2 2D coil and a method of obtaining EC response of 3D coils using the 2D coil configuration Physics 0 Active
US9476859B2 Automatic calibration for phased array inspection of girth weld Physics 0 Active
US11029289B2 Ultrasonic TFM with calculated angle beams Physics 0 Active
US10775346B2 Virtual channels for eddy current array probes Physics 0 Active
US10908122B2 Total focusing method adaptively corrected by using plane wave Physics 0 Active
US10561404B2 Gapless calibration method for phased array ultrasonic inspection Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.