Patent · US Active

Testing MOS power switches

US10782334B2 · kind B2 · utility

1Cited by

2References

14Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventor

Michael Asam · Aichach, DE

Key dates

Filing date	Aug 16, 2017
Grant date	Sep 22, 2020
Priority date	—
Expiry date	Mar 26, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/3277
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and devices are discussed relating to testing of MOS switch transistors. For example, at least two different test measurements may be performed, and a fault state may be determined based on the at least two test measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.